%APamula, Venkata%ASun, Xun%AKim, Sung%ARahman, Fahim%AZhang, Baosen%ASathe, Visvesh%Anull Ed.%BJournal Name: IEEE Solid-State Circuits Letters; Journal Volume: 1; Journal Issue: 12 %D2018%I %JJournal Name: IEEE Solid-State Circuits Letters; Journal Volume: 1; Journal Issue: 12 %K %MOSTI ID: 10213689 %PMedium: X %TA 65-nm CMOS 3.2-to-86 Mb/s 2.58 pJ/bit Highly Digital True-Random-Number Generator With Integrated De-Correlation and Bias Correction %X %0Journal Article