%ASaha, A.%ASi, M.%ANi, K.%ADatta, S.%AYe, P.%AGupta, S.%Anull Ed.%D2020%I %K %MOSTI ID: 10285987 %PMedium: X %TFerroelectric Thickness Dependent Domain Interactions in FEFETs for Memory and Logic: A Phase-field Model based Analysis %X Country unknown/Code not availablehttps://doi.org/10.1109/IEDM13553.2020.9372099OSTI-MSA