Journal ArticleHigh Precision Detection of Change in Intermediate Range Order of Amorphous Zirconia-Doped Tantala Thin Films Due to AnnealingPrasai, K.; Jiang, J.; Mishkin, A.; Shyam, B.; Angelova, S.; Birney, R.; Drabold, D. A.; Fazio, M.; Gustafson, E. K.; Harry, G.; Hoback, S.; Hough, J.; Lévesque, C.; MacLaren, I.; Markosyan, A.; Martin, I. W.; Menoni, C. S.; Murray, P. G.; Penn, S.; Reid, S.; Robie, R.; Rowan, S.; Schiettekatte, F.; Shink, R.; Turner, A.; Vajente, G.; Cheng, H-P.; Fejer, M. M.; Mehta, A.; Bassiri, R.2019-07-0110107401Physical Review Letters12340031-9007https://doi.org/10.1103/PhysRevLett.123.0455011708175; 1707870; 1707863; 1611821; 1707866; 1708010; 1707964National Science Foundation