Journal ArticleEnergy-Coupling Mechanisms Revealed through Simultaneous Keyhole Depth and Absorptance Measurements during Laser-Metal ProcessingAllen, Troy R.; Huang, Wenkang; Tanner, Jack R.; Tan, Wenda; Fraser, James M.; Simonds, Brian J.null2020-06-0110219951Physical Review Applied1362331-7019https://doi.org/10.1103/PhysRevApplied.13.0640701752218National Science Foundation