<?xml version="1.0" encoding="UTF-8"?><rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcq="http://purl.org/dc/terms/"><records count="1" morepages="false" start="1" end="1"><record rownumber="1"><dc:product_type>Journal Article</dc:product_type><dc:title>Probing exchange bias at the surface of a doped ferrimagnetic insulator</dc:title><dc:creator>Wang, Yang; Wang, Xiao; Clark, Andy T.; Chen, Hang; Cheng, Xuemei M.; Freeland, John W.; Xiao, John Q.</dc:creator><dc:corporate_author/><dc:editor>null</dc:editor><dc:description/><dc:publisher/><dc:date>2021-07-01</dc:date><dc:nsf_par_id>10281196</dc:nsf_par_id><dc:journal_name>Physical Review Materials</dc:journal_name><dc:journal_volume>5</dc:journal_volume><dc:journal_issue>7</dc:journal_issue><dc:page_range_or_elocation/><dc:issn>2475-9953</dc:issn><dc:isbn/><dc:doi>https://doi.org/10.1103/PhysRevMaterials.5.074409</dc:doi><dcq:identifierAwardId>1708790</dcq:identifierAwardId><dc:subject/><dc:version_number/><dc:location/><dc:rights/><dc:institution/><dc:sponsoring_org>National Science Foundation</dc:sponsoring_org></record></records></rdf:RDF>