Conference PaperFull-Speed Testing of Silicon Photonic Electro-Optic Modulators from Picowatt-level Scattered LightWang, Xiaoxi; Korzh, Boris A.; Shaw, Matthew D.; Mookherjea, ShayannullWe demonstrate a technique for measuring the full-speed performance of integrated modulators from ultraweak surface-coupled and scattered light. This can enable rapid characterization of unpackaged, high-speed wafer-scale integrated photonics without test ports or special fabrication.2020-03-0810282996Optical Fiber Communication ConferenceTh4A.7https://doi.org/10.1364/OFC.2020.Th4A.71640968National Science Foundation