<?xml version="1.0" encoding="UTF-8"?><rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcq="http://purl.org/dc/terms/"><records count="1" morepages="false" start="1" end="1"><record rownumber="1"><dc:product_type>Journal Article</dc:product_type><dc:title>Photoluminescence from GaN Implanted with Be and F</dc:title><dc:creator>Reshchikov, Michael Alexander; Andrieiev, Oleksandr; Vorobiov, Mykhailo; Demchenko, Denis O.; McEwen, Benjamin; Shahedipour-Sandvik, Shadi</dc:creator><dc:corporate_author/><dc:editor/><dc:description>GaN samples were implanted with Be and F and annealed in different conditions to activate the BeGa acceptors. Photoluminescence spectra were studied to recognize the defects. The UVLBe band with a maximum at 3.38 eV and the YLBe band with a maximum at 2.15 eV were observed and associated with Be. The sequential implantation of Be and F ions into GaN at 600 °C reduces the concentration of nitrogen vacancies (VN), as evidenced by the lack of the green luminescence band associated with the isolated nitrogen vacancy. First‐principles calculations were employed to find parameters of defects that can form after implantation.</dc:description><dc:publisher/><dc:date>2023-05-16</dc:date><dc:nsf_par_id>10429919</dc:nsf_par_id><dc:journal_name>physica status solidi (b)</dc:journal_name><dc:journal_volume/><dc:journal_issue/><dc:page_range_or_elocation>2300131</dc:page_range_or_elocation><dc:issn>0370-1972</dc:issn><dc:isbn/><dc:doi>https://doi.org/10.1002/pssb.202300131</dc:doi><dcq:identifierAwardId>1904861</dcq:identifierAwardId><dc:subject/><dc:version_number/><dc:location/><dc:rights/><dc:institution/><dc:sponsoring_org>National Science Foundation</dc:sponsoring_org></record></records></rdf:RDF>