<?xml version="1.0" encoding="UTF-8"?><rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcq="http://purl.org/dc/terms/"><records count="1" morepages="false" start="1" end="1"><record rownumber="1"><dc:product_type>Journal Article</dc:product_type><dc:title>Accelerated Degradation Of Copper Cold Plates In Direct-to-Chip Liquid Cooling in Data Centers</dc:title><dc:creator>CHINTHAPARTHY, LOCHAN_SAI_REDDY; SAINI, SATYAM; SHAHI, PARDEEP; BANSODE, PRATIK_VITHOBA; MODI, HIMANSHU_GIRISHCHANDRA; AGONAFER, DEREJE</dc:creator><dc:corporate_author/><dc:editor/><dc:description>Increasing demands for cloud-based computing and storage, the Internet of Things and machine learning-based applications have necessitated the use of more eficient cooling technologies. Direct-to-chip liquid cooling using cold plates has proven to be one of the most effective methods to dissipate the high heat luxes of modern high-power CPUs and graphics processing units (GPU). While the published literature has well-documented research on the thermal aspects of direct liquid cooling, a detailed account of reliability degradation is missing. The present investigation provides an in-depth experimental analysis of the accelerated degradation of copper cold plates used in high-power direct-to-chip liquid cooling in data centers.</dc:description><dc:publisher>ASHRAE</dc:publisher><dc:date>2024-02-29</dc:date><dc:nsf_par_id>10537808</dc:nsf_par_id><dc:journal_name>ASHRAE journal</dc:journal_name><dc:journal_volume/><dc:journal_issue/><dc:page_range_or_elocation/><dc:issn>0001-2491</dc:issn><dc:isbn/><dc:doi>https://doi.org/</dc:doi><dcq:identifierAwardId>2209751</dcq:identifierAwardId><dc:subject/><dc:version_number/><dc:location/><dc:rights/><dc:institution/><dc:sponsoring_org>National Science Foundation</dc:sponsoring_org></record></records></rdf:RDF>