Journal ArticleSense and React: Self-Destructive Polymorphic Mechanism Against Voltage Tampered Active Physical AttacksRoy, Sourav; Cannon, Andrew; de_la_Mata, Luis; Yu_Acharya, Rabin; Farheen, Tasnuva; Tajik, Shahin; Forte, DomenicIEEE2025-05-0110587034IEEE Transactions on Very Large Scale Integration (VLSI) Systems1 to 141063-8210https://doi.org/10.1109/TVLSI.2025.35504312150122National Science Foundation