Journal ArticleDirect electron detection for EBSD of low symmetry & beam sensitive ceramicsDella_Ventura, Nicolò M; Ericks, Andrew R; Echlin, McLean P; Moore, Kalani; Pollock, Tresa M; Begley, Matthew R; Zok, Frank W; De_Graef, Marc; Gianola, Daniel SElectron backscatter diffraction (EBSD) is a powerful tool for determining the orientations of near-surface grains in engineering materials. However, many ceramics present challenges for routine EBSD data collection and indexing due to small grain sizes, high crack densities, beam and charge sensitivities, low crystal symmetries, and pseudo-symmetric pattern variants. Micro-cracked monoclinic hafnia, tetragonal hafnon, and hafnia/hafnon composites exhibit all such features, and are used in the present work to show the efficacy of a novel workflow based on a direct detecting EBSD sensor and a state-of-the-art pattern indexing approach. At 5 and 10 keV primary beam energies (where beam-induced damage and surface charge accumulation are minimal), the direct electron detector produces superior diffraction patterns with 10x lower doses compared to a phosphor-coupled indirect detector. Further, pseudo-symmetric variant-related indexing errors from a Hough-based approach (which account for at least 4%-14% of map areas) are easily resolved by dictionary indexing. In short, the workflow unlocks fundamentally new opportunities to characterize materials historically unsuited for EBSD.Elsevier BV2025-01-0110600890Ultramicroscopy268C1140790304-3991https://doi.org/10.1016/j.ultramic.2024.1140792203378; 2117843Electron backscatter diffractionDirect electron detectionDictionary indexingCeramicsBeam sensitive materialsNational Science Foundation