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Detection of hot electrons originating from an upper valley at ∼1.7eV above the Γ valley in wurtzite GaN using electron emission spectroscopy

https://doi.org/10.1103/PhysRevB.107.035303

Ho, Wan Ying ; Alhassan, Abdullah I. ; Lynsky, Cheyenne ; Chow, Yi Chao ; Myers, Daniel J. ; DenBaars, Steven P. ; Nakamura, Shuji ; Peretti, Jacques ; Weisbuch, Claude ; Speck, James S. ( January 2023 , Physical Review B)

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Localization Effect in Photoelectron Transport Induced by Alloy Disorder in Nitride Semiconductor Compounds

https://doi.org/10.1103/PhysRevLett.129.216602

Sauty, Mylène ; Lopes, Nicolas M. S. ; Banon, Jean-Philippe ; Lassailly, Yves ; Martinelli, Lucio ; Alhassan, Abdullah ; Chow, Yi Chao ; Nakamura, Shuji ; Speck, James S. ; Weisbuch, Claude ; et al ( November 2022 , Physical Review Letters)

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Unidirectional luminescence from InGaN/GaN quantum-well metasurfaces

https://doi.org/10.1038/s41566-020-0641-x

Iyer, Prasad P. ; DeCrescent, Ryan A. ; Mohtashami, Yahya ; Lheureux, Guillaume ; Butakov, Nikita A. ; Alhassan, Abdullah ; Weisbuch, Claude ; Nakamura, Shuji ; DenBaars, Steven P. ; Schuller, Jon. A. ( September 2020 , Nature Photonics)
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Barriers to carrier transport in multiple quantum well nitride-based c -plane green light emitting diodes

https://doi.org/10.1103/PhysRevMaterials.4.054604

Lynsky, Cheyenne ; Alhassan, Abdullah I. ; Lheureux, Guillaume ; Bonef, Bastien ; DenBaars, Steven P. ; Nakamura, Shuji ; Wu, Yuh-Renn ; Weisbuch, Claude ; Speck, James S. ( May 2020 , Physical Review Materials)

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Efficient tunnel junction contacts for high-power semipolar III-nitride edge-emitting laser diodes

https://doi.org/10.1364/OE.27.008327

Hamdy, Shereen W. ; Young, Erin C. ; Alhassan, Abdullah I. ; Becerra, Daniel L. ; DenBaars, Steven P. ; Speck, James S. ; Nakamura, Shuji ( March 2019 , Optics Express)
High luminous efficacy green light-emitting diodes with AlGaN cap layer

https://doi.org/10.1364/OE.24.017868

Alhassan, Abdullah I. ; Farrell, Robert M. ; Saifaddin, Burhan ; Mughal, Asad ; Wu, Feng ; DenBaars, Steven P. ; Nakamura, Shuji ; Speck, James S. ( August 2016 , Optics Express)