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The paper summarizes the single-event upset (SEU) results obtained from neutron testing on the UltraScale+ MPSoC ZU9EG device. This complex device contains a large amount of programmable logic and multiple processor cores. Tests were performed on the programmable logic and the processing system simultaneously. Estimates of the single-event upset neutron cross section were obtained for the programmable logic CRAM, BRAM, OCM memory, and cache memories. During the test, no processor crashes or silent data corruptions were observed. In addition, a processor failure cross section was estimated for several software benchmark operating on the various processor cores. Several FPGA CRAM scrubbers were tested including an external JTAG, the Xilinx “SEM” IP, and the use of the PCAP operating in baremetal. In parallel with these tests, single-event induced high current events were monitored using an external power supply and monitoring scripts.