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Worst-Case Electromagnetic Coupling to an Accelerometer using an Equivalent Circuit and Experimental Co-Characterization Methodology

https://doi.org/10.1109/USNC-URSI52151.2023.10237556

Hamdalla, Mohamed Z. ; Ory, Thomas ; Harmon, Aaron ; Beetner, Daryl ; Khilkevich, Victor ; McGeehan, John ; Willits, John ; Caruso, Anthony N. ; Hassan, Ahmed M ( July 2023 , 2023 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (USNC-URSI))

Free, publicly-accessible full text available July 23, 2024
Characteristic Mode Analysis Prediction and Guidance of Electromagnetic Coupling Measurements to a UAV Model

https://doi.org/10.1109/ACCESS.2021.3138296

Hamdalla, Mohamed Z. ; Bissen, Benjamin ; Hunter, James D. ; Liu, Yuanzhuo ; Khilkevich, Victor ; Beetner, Daryl G. ; Caruso, Anthony N. ; Hassan, Ahmed M. ( January 2022 , IEEE Access)

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Underlying role of mechanical rigidity and topological constraints in physical sputtering and reactive ion etching of amorphous materials

https://doi.org/10.1103/PhysRevMaterials.2.055602

Bhattarai, Gyanendra ; Dhungana, Shailesh ; Nordell, Bradley J. ; Caruso, Anthony N. ; Paquette, Michelle M. ; Lanford, William A. ; King, Sean W. ( May 2018 , Physical Review Materials)
Review—Investigation and Review of the Thermal, Mechanical, Electrical, Optical, and Structural Properties of Atomic Layer Deposited High- k Dielectrics: Beryllium Oxide, Aluminum Oxide, Hafnium Oxide, and Aluminum Nitride

https://doi.org/10.1149/2.0091710jss

Gaskins, John T. ; Hopkins, Patrick E. ; Merrill, Devin R. ; Bauers, Sage R. ; Hadland, Erik ; Johnson, David C. ; Koh, Donghyi ; Yum, Jung Hwan ; Banerjee, Sanjay ; Nordell, Bradley J. ; et al ( January 2017 , ECS Journal of Solid State Science and Technology)

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