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Abstract We show the effects of ladder ionization and hyperfine quenching on charge state distributions and spectral features of ions in electron beam ion trap (EBIT) devices. Ladder ionization with intermediate excitation of metastable states proceeds at lower than ionization potential electron beam energies, while hyperfine quenching reduces the lifetimes of these states by enhancing particular decay channels through nuclear-electronic coupling. Using Ni-like Pr and Nd ions, we show that these processes significantly alter ion populations and spectra, emphasizing the importance of incorporating hyperfine level specific modeling in EBIT studies.more » « lessFree, publicly-accessible full text available June 1, 2026
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