skip to main content

Attention:

The NSF Public Access Repository (NSF-PAR) system and access will be unavailable from 11:00 PM ET on Thursday, October 10 until 2:00 AM ET on Friday, October 11 due to maintenance. We apologize for the inconvenience.

Explore Research Products in the NSF-PAR

  • Home
  • Search Results
  • Page 1 of 1

Search for: All records

Creators/Authors contains: "Falaggis, K"

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. ; ; ; ; ; ; ( , CIRP)
    Freeform optical surfaces offer significant design opportunities but pose new challenges in metrology and manufacturing. Evolution in optics manufacturing processes have changed the surface spatial frequencies that must be measured. Optical surface definition is expected to be with respect to fiducials and datums which must be realizable at all stages of manufacture; uncertainty in that realization becomes important in some cases. Concurrent engineering is required, but appropriate data has not been collated for use by optical designers. One approach to providing such data is described. 
    more » « less
    Full Text Available