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Three-step field-plated β-Ga 2 O 3 Schottky barrier diodes and heterojunction diodes with sub-1 V turn-on and kilovolt-class breakdown

https://doi.org/10.35848/1882-0786/ad36ab

Gilankar, Advait ; Islam, Ahmad Ehteshamul ; McCartney, Martha R. ; Katta, Abishek ; Das, Nabasindhu ; Smith, David J. ; Kalarickal, Nidhin Kurian ( April 2024 , Applied Physics Express)

Abstract
A unique field termination structure combining a three-step field plate with nitrogen ion implantation to enhance the reverse breakdown performance of Pt/β-Ga₂O₃Schottky barrier diodes (SBDs) and NiO/β-Ga₂O₃heterojunction diodes (HJDs) is reported. The fabricated devices showed a lowR_on,spof 6.2 mΩ cm²for SBDs and 6.8 mΩ cm²for HJDs. HJDs showed a 0.8 V turn-on voltage along with an ideality factor of 1.1 leading to a low effective on-resistance of 18 mΩ cm². The devices also showed low reverse leakage current (<1 mA cm⁻²) and a breakdown voltage of ∼1.4 kV. These results offer an alternative, simpler route for fabricating high-performance kilovolt-classβ-Ga₂O₃diodes.

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The Impact of Artificial Intelligence on In Situ Electron Microscopy

https://doi.org/10.1093/micmic/ozad067.1105

Crozier, Peter A ; Morales, Adrià Marcos ; Leibovich, Matan ; Mohan, Sreyas ; Haluai, Piyush ; Tan, Mai ; Vincent, Joshua ; Gilankar, Advait ; Wang, Yifan ; Fernandez-Granda, Carlos ( July 2023 , Microscopy and Microanalysis)

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Application of Deep Unsupervised Convolutional Neural Networks to Denoise Large Temporally Resolved In Situ TEM Datasets

https://doi.org/10.1017/S1431927622011618

Morales, Adrià Marcos ; Gilankar, Advait ; Manzorro, Ramon ; Haluai, Piyush ; Tan, Mai ; Vincent, Joshua L. ; Fernandez-Granda, Carlos ; Crozier, Peter A. ( August 2022 , Microscopy and Microanalysis)

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Detecting and Characterizing the Fluxionality in Pt Nanoparticles

https://doi.org/10.1017/S1431927622001568

Gilankar, Advait ; Miller, Benjamin K. ; Morales, Adrià Marcos ; Haluai, Piyush ; Tan, Mai ; Vincent, Joshua L. ; Fernandez-Granda, Carlos ; Crozier, Peter A. ( August 2022 , Microscopy and Microanalysis)

Full Text Available