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Fabrication of chemically and structurally abrupt ${Eu}_{1 - x} {La}_{x} O / SrO / Si$ interfaces and their analysis by STEM-EELS

https://doi.org/10.1103/PhysRevMaterials.5.124419

Held, R. ; Mundy, J. A. ; Holtz, M. E. ; Hodash, D. ; Mairoser, T. ; Muller, D. A. ; Schlom, D. G. ( December 2021 , Physical Review Materials)

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Exploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films

https://doi.org/10.1103/PhysRevMaterials.4.104412

Held, R. ; Mairoser, T. ; Melville, A. ; Mundy, J. A. ; Holtz, M. E. ; Hodash, D. ; Wang, Z. ; Heron, J. T. ; Dacek, S. T. ; Holländer, B. ; et al ( October 2020 , Physical Review Materials)

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