skip to main content

Search for: All records

Creators/Authors contains: "Hong, Y."

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. Free, publicly-accessible full text available July 1, 2023
  2. Guichard, P. ; Hamel, V. (Ed.)
    This chapter describes two mechanical expansion microscopy methods with accompanying step-by-step protocols. The first method, mechanically resolved expansion microscopy, uses non-uniform expansion of partially digested samples to provide the imaging contrast that resolves local mechanical properties. Examining bacterial cell wall with this method, we are able to distinguish bacterial species in mixed populations based on their distinct cell wall rigidity and detect cell wall damage caused by various physiological and chemical perturbations. The second method is mechanically locked expansion microscopy, in which we use a mechanically stable gel network to prevent the original polyacrylate network from shrinking in ionic buffers.more »This method allows us to use anti-photobleaching buffers in expansion microscopy, enabling detection of novel ultra-structures under the optical diffraction limit through super-resolution single molecule localization microscopy on bacterial cells and whole-mount immunofluorescence imaging in thick animal tissues. We also discuss potential applications and assess future directions.« less
  3. The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost-constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi-analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three-level compromise plan.more »The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost-constrained ADT plan, compared with conventional optimal plans by grid search algorithms.« less
  4. Traditional accelerated life test plans are typically based on optimizing the C-optimality for minimizing the variance of an interested quantile of the lifetime distribution. These methods often rely on some specified planning values for the model parameters, which are usually unknown prior to the actual tests. The ambiguity of the specified parameters can lead to suboptimal designs for optimizing the reliability performance of interest. In this paper, we propose a sequential design strategy for life test plans based on considering dual objectives. In the early stage of the sequential experiment, we suggest allocating more design locations based on optimizing themore »D-optimality to quickly gain precision in the estimated model parameters. In the later stage of the experiment, we can allocate more observations based on optimizing the C-optimality to maximize the precision of the estimated quantile of the lifetime distribution. We compare the proposed sequential design strategy with existing test plans considering only a single criterion and illustrate the new method with an example on the fatigue testing of polymer composites.« less