Gallium nitride high-electron-mobility transistors (GaN HEMTs) are at a point of rapid growth in defense (radar, SATCOM) and commercial (5G and beyond) industries. This growth also comes at a point at which the standard GaN heterostructures remain unoptimized for maximum performance. For this reason, we propose the shift to the aluminum nitride (AlN) platform. AlN allows for smarter, highly-scaled heterostructure design that will improve the output power and thermal management of III-nitride amplifiers. Beyond improvements over the incumbent amplifier technology, AlN will allow for a level of integration previously unachievable with GaN electronics. State-of-the-art high-current p-channel FETs, mature filter technology, and advanced waveguides, all monolithically integrated with an AlN/GaN/AlN HEMT, is made possible with AlN. It is on this new AlN platform that nitride electronics may maximize their full high-power, high-speed potential for mm-wave communication and high-power logic applications.
- Home
- Search Results
- Page 1 of 1
Search for: All records
-
Total Resources4
- Resource Type
-
00040
- Availability
-
31
- Author / Contributor
- Filter by Author / Creator
-
-
Chaudhuri, Reet (4)
-
Hwang, James C. M. (4)
-
Jena, Debdeep (4)
-
Nomoto, Kazuki (4)
-
Hickman, Austin (3)
-
Li, Lei (3)
-
Xing, Huili Grace (3)
-
Bader, Samuel James (2)
-
Asadi, Mohammad Javad (1)
-
Elliott, Michael (1)
-
Fabi, Gianluca (1)
-
Farina, Marco (1)
-
Grace Xing, Huili (1)
-
Guidry, Matthew (1)
-
Hickman, Austin Lee (1)
-
Moser, Neil (1)
-
Shinohara, Keisuke (1)
-
Wang, Xiaopeng (1)
-
#Tyler Phillips, Kenneth E. (0)
-
& Abreu-Ramos, E. D. (0)
-
- Filter by Editor
-
-
& Spizer, S. M. (0)
-
& . Spizer, S. (0)
-
& Ahn, J. (0)
-
& Bateiha, S. (0)
-
& Bosch, N. (0)
-
& Brennan K. (0)
-
& Brennan, K. (0)
-
& Chen, B. (0)
-
& Chen, Bodong (0)
-
& Drown, S. (0)
-
& Ferretti, F. (0)
-
& Higgins, A. (0)
-
& J. Peters (0)
-
& Kali, Y. (0)
-
& Ruiz-Arias, P.M. (0)
-
& S. Spitzer (0)
-
& Spitzer, S. (0)
-
& Spitzer, S.M. (0)
-
2022 USENIX Annual Technical Conference (0)
-
2023 4th International Conference on Big Data Analytics and Practices (IBDAP), 2023 (0)
-
-
Have feedback or suggestions for a way to improve these results?
!
Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
Abstract -
Hickman, Austin ; Chaudhuri, Reet ; Li, Lei ; Nomoto, Kazuki ; Moser, Neil ; Elliott, Michael ; Guidry, Matthew ; Shinohara, Keisuke ; Hwang, James C. M. ; Xing, Huili Grace ; et al ( , physica status solidi (a))
Aluminum nitride (AlN) offers novel potential for electronic integration and performance benefits for high‐power, millimeter‐wave amplification. Herein, load‐pull power performance at 30 and 94 GHz for AlN/GaN/AlN high‐electron‐mobility transistors (HEMTs) on silicon carbide (SiC) is reported. When tuned for peak power‐added efficiency (PAE), the reported AlN/GaN/AlN HEMT shows PAE of 25% and 15%, with associated output power () of 2.5 and 1.7 W mm−1, at 30 and 94 GHz, respectively. At 94 GHz, the maximum generated is 2.2 W mm−1, with associated PAE of 13%.
-
Hickman, Austin ; Chaudhuri, Reet ; Li, Lei ; Nomoto, Kazuki ; Bader, Samuel James ; Hwang, James C. M. ; Xing, Huili Grace ; Jena, Debdeep ( , IEEE Journal of the Electron Devices Society)
-
Quantitative scanning microwave microscopy of 2D electron and hole gases in AlN/GaN heterostructuresWang, Xiaopeng ; Fabi, Gianluca ; Chaudhuri, Reet ; Hickman, Austin ; Asadi, Mohammad Javad ; Nomoto, Kazuki ; Xing, Huili Grace ; Jena, Debdeep ; Farina, Marco ; Hwang, James C. M. ( , Applied Physics Letters)