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Artificial Intelligence is poised to transform the design of complex, large-scale detectors like ePIC at the future Electron Ion Collider. Featuring a central detector with additional detecting systems in the far forward and far backward regions, the ePIC experiment incorporates numerous design parameters and objectives, including performance, physics reach, and cost, constrained by mechanical and geometric limits.This project aims to develop a scalable, distributed AI-assisted detector design for the EIC (AID(2)E), employing state-of-the-art multiobjective optimization to tackle complex designs. Supported by the ePIC software stack and usingGeant4simulations, our approach benefits from transparent parameterization and advanced AI features.The workflow leverages the PanDA and iDDS systems, used in major experiments such as ATLAS at CERN LHC, the Rubin Observatory, and sPHENIX at RHIC, to manage the compute intensive demands of ePIC detector simulations. Tailored enhancements to the PanDA system focus on usability, scalability, automation, and monitoring.Ultimately, this project aims to establish a robust design capability, apply a distributed AI-assisted workflow to the ePIC detector, and extend its applications to the design of the second detector (Detector-2) in the EIC, as well as to calibration and alignment tasks. Additionally, we are developing advanced data science tools to efficiently navigate the complex, multidimensional trade-offs identified through this optimization process.

All experiments observing dilepton pairs (e.g.e⁺e^-,  μ⁺μ^-) must confront the existence of acombinatoricbackground caused by the combining of tracks not arising from the same physics vertex. Some method must be devised to calculate and remove this background. In this document we describe a particular event-mixing method relying on many of the unique aspects of the SeaQuest spectrometer and data. The method described here calculates the combinatoric background with correct normalization; i.e., there is no need to assign a floating normalization factor that is then determined in a subsequent fitting procedure. Numerous tests are applied to demonstrate the reliability of the method.