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Abstract Mixed‐conducting perovskites are workhorse electrochemically active materials, but typical high‐temperature processing compromises their catalytic activity and chemo‐mechanical integrity. Low‐temperature pulsed laser deposition of amorphous films plus mild thermal annealing is an emerging route to form homogeneous mixed conductors with exceptional catalytic activity, but little is known about the evolution of the oxide‐ion transport and transference numbers during crystallization. Here the coupled evolution of ionic and electronic transport behavior and structure in room‐temperature‐grown amorphous (La,Sr)(Ga,Fe)O_3‐xfilms as they crystallize is explored.In situ ac‐impedance spectroscopy with and without blocking electrodes, simultaneous capturingsynchrotron‐grazing‐incidence X‐ray diffraction, dc polarization, transmission electron microscopy, and molecular dynamics simulations are combined to evaluate isothermal and non‐isothermal crystallization effects and the role of grain boundaries on transference numbers. Ionic conductivity increases by ≈2 orders of magnitude during crystallization, with even larger increases in electronic conductivity. Consequently, as crystallinity increases, LSGF transitions from a predominantly ionic conductor to a predominantly electronic conductor. The roles of evolving lattice structural order, microstructure, and defect chemistry are examined. Grain boundaries appear relatively nonblocking electronically but significantly blocking ionically. The results demonstrate that ionic transference numbers can be tailored over a wide range by tuning crystallinity and microstructure without having to change the cation composition. 

In oxide materials, an increase in oxygen vacancy concentration often results in lattice expansion, a phenomenon known as chemical expansion that can introduce detrimental stresses and lead to potential device failure. One factor often implicated in the chemical expansion of materials is the degree of localization of the multivalent cation electronic states. When an oxygen is removed from the lattice and a vacancy forms, it is believed that the two released electrons reduce multivalent cations and expand the lattice, with more localized cation states resulting in larger expansion. In this work, we computationally and experimentally studied the chemical expansion of two Pr-based perovskites that exhibit ultra-low chemical expansion, PrGa 1− x Mg x O 3− δ and BaPr 1− x Y x O 3− δ , and their parent compounds PrGaO 3− δ and BaPrO 3− δ . Using density functional theory, the degree of localization of the Pr-4f electrons was varied by adjusting the Hubbard U parameter. We find that the relationship between Pr-4f electron localization and chemical expansion exhibits more complexity than previously established. This relationship depends on the nature of the states filled by the two electrons, which may not necessarily involve the reduction of Pr. F ′-center defects can form if the reduction of Pr is unfavorable, leading to smaller chemical expansions. If hole states are present in the material, the states filled by the electrons can be Pr-4f and/or O-2p hole states depending on the degree of Pr-4f localization. The O-2p holes are more delocalized than the Pr-4f holes, resulting in smaller chemical expansions when the O-2p holes are filled. X-ray photoelectron spectroscopy reveals low concentrations of Pr 4+ in PrGa 0.9 Mg 0.1 O 3− δ and BaPr 0.9 Y 0.1 O 3− δ , supporting the possible role of O-2p holes in the low chemical expansions exhibited by these materials. This work highlights the non-trivial effects of electron localization on chemical expansion, particularly when hole states are present, pointing to design strategies to tune the chemical expansion of materials. 

Recent work has demonstrated a low-temperature route to fabricating mixed ionic/electronic conducting (MIEC) thin films with enhanced oxygen exchange kinetics by crystallizing amorphous-grown thin films under mild temperatures, eluding conditions for deleterious A-site cation surface segregation. Yet, the complex, multiscale chemical and structural changes during MIEC crystallization and their implications for the electrical properties remain relatively unexplored. In this work, micro-structural and atomic-scale structural and chemical changes in crystallizing SrTi 0.65 Fe 0.35 O 3− δ thin films on insulating (0001)-oriented Al 2 O 3 substrates are observed and correlated to changes in the in-plane electrical conductivity, measured in situ by ac impedance spectroscopy. Synchrotron X-ray absorption spectroscopy at the Fe and Ti K-edges gives direct evidence of oxidation occurring with the onset of crystallization and insight into the atomic-scale structural changes driven by the chemical changes. The observed oxidation, increase in B-site polyhedra symmetry, and alignment of neighboring B-site cation coordination units demonstrate increases in both hole concentration and mobility, thus underpinning the measured increase of in-plane conductivity by over two orders of magnitude during crystallization. High resolution transmission electron microscopy and spectroscopy of films at various degrees of crystallinity reveal compositional uniformity with extensive nano-porosity in the crystallized films, consistent with solid phase contraction expected from both oxidation and crystallization. We suggest that this chemo-mechanically driven dynamic nano-structuring is an additional contributor to the observed electrical behavior. By the point that the films become ∼60% crystalline (according to X-ray diffraction), the conductivity reaches the value of dense, fully crystalline films. Given the resulting high electronic conductivity, this low-temperature processing route leading to semi-crystalline hierarchical films exhibits promise for developing high performance MIECs for low-to-intermediate temperature applications.