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Taz, Humaira ; Prasad, Bhagwati ; Huang, Yen-Lin ; Chen, Zuhuang ; Hsu, Shang-Lin ; Xu, Ruijuan ; Thakare, Vishal ; Sakthivel, Tamil Selvan ; Liu, Chenze ; Hettick, Mark ; et al ( , Scientific Reports)
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Prasad, Bhagwati ; Huang, Yen‐Lin ; Chopdekar, Rajesh V. ; Chen, Zuhuang ; Steffes, James ; Das, Sujit ; Li, Qian ; Yang, Mengmeng ; Lin, Chia‐Ching ; Gosavi, Tanay ; et al ( , Advanced Materials)null (Ed.)
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Prasad, Bhagwati ; Pfanzelt, Georg ; Fillis-Tsirakis, Evangelos ; Zachman, Michael J. ; Kourkoutis, Lena F. ; Mannhart, Jochen ( , Advanced Materials)
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Barrozo, Petrucio ; Småbråten, Didrik René ; Tang, Yun‐Long ; Prasad, Bhagwati ; Saremi, Sahar ; Ozgur, Rustem ; Thakare, Vishal ; Steinhardt, Rachel A. ; Holtz, Megan E. ; Stoica, Vladimir Alexandru ; et al ( , Advanced Materials)
Abstract Results of switching behavior of the improper ferroelectric LuFeO3are presented. Using a model set of films prepared under controlled chemical and growth‐rate conditions, it is shown that defects can reduce the quasi‐static switching voltage by up to 40% in qualitative agreement with first‐principles calculations. Switching studies show that the coercive field has a stronger frequency dispersion for the improper ferroelectrics compared to a proper ferroelectric such as PbTiO3. It is concluded that the primary structural order parameter controls the switching dynamics of such improper ferroelectrics.