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  1. This paper presents a technique for rapid site-selective control of the quantum state of particles in a large array using the combination of a fast deflector (e.g., an acousto-optic deflector) and a relatively slow spatial light modulator (SLM). The use of SLMs for site-selective quantum state manipulation has been limited due to slow transition times that prevent rapid, consecutive quantum gates. By partitioning the SLM into multiple segments and using a fast deflector to transition between them, it is possible to substantially reduce the average time increment between scanner transitions by increasing the number of gates that can be performed for a single SLM full-frame setting. We analyzed the performance of this device in two different configurations: In configuration 1, each SLM segment addresses the full qubit array; in configuration 2, each SLM segment addresses a subarray and an additional fast deflector positions that subarray with respect to the full qubit array. With these hybrid scanners, we calculated qubit addressing rates that are tens to hundreds of times faster than using an SLM alone.

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  2. Free, publicly-accessible full text available April 1, 2024
  3. We report on accurate measurements of the hyperfine constants of the narrow cooling transition of neutral Holmium at 412.1 nm. This transition has a linewidth of 2.3 MHz and a Doppler temperature of 55 microK which renders it suitable for second stage laser cooling. The proximity of the wavelength to the strong cooling transition at 410.5 nm[1] renders this transition convenient for first and second stage cooling using a combined optical setup. The hyperfine constants were measured using Doppler free saturated absorption spectroscopy in a hollow cathode discharge. Relative measurements of the locations of the hyperfine levels were made using an EOM modulator with an RF offset relative to a stable ULE cavity reference. The A and B hyperfine constants were determined to be A= 715.85±0.15 MHz and B= 1013±16.0 MHz which significantly improves on the precision of earlier measurements. 
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