Search for: All records

Semiconductor microcavities are frequently studied in the context of semiconductor lasers and in application-oriented fundamental research on topics such as linear and nonlinear polariton systems, polariton lasers, polariton pattern formation, and polaritonic Bose–Einstein condensates. A commonly used approach to describe theoretical properties includes a phenomenological single-mode equation that complements the equation for the nonlinear optical response (interband polarization) of the semiconductor. Here, we show how to replace the single-mode equation by a fully predictive transfer function method that, in contrast to the single-mode equation, accounts for propagation, retardation, and pulse-filtering effects of the incident light field traversing the distributed Bragg reflector (DBR) mirrors, without substantially increasing the numerical complexity of the solution. As examples, we use cavities containing GaAs quantum wells and transition-metal dichalcogenides (TMDs). 

Abstract Data collected so far by the Pierre Auger Observatory have enabled major advances in ultra-high energy cosmic ray physics and demonstrated that improved determination of masses of primary cosmic-ray particles, preferably on an event-by-event basis, is necessary for understanding their origin and nature. Improvement in primary mass measurements was the main motivation for the upgrade of the Pierre Auger Observatory, called AugerPrime. As part of this upgrade, scintillator detectors are added to the existing water-Cherenkov surface detector stations. By making use of the differences in detector response to the electromagnetic particles and muons between scintillator and water-Cherenkov detectors, the electromagnetic and muonic components of cosmic-ray air showers can be disentangled. Since the muonic component is sensitive to the primary mass, such combination of detectors provides a powerful way to improve primary mass composition measurements over the original Auger surface detector design. In this paper, the so-called Scintillator Surface Detectors are discussed, including their design characteristics, production process, testing procedure and deployment in the field.