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Electron Beam Induced Current Study of Photocurrent Gain in κ-Ga ₂ O ₃ Schottky Diodes

https://doi.org/10.1149/2162-8777/acce6d

Yakimov, E. B.; Nikolaev, V. I.; Pechnikov, A. I.; Polyakov, A. Y.; Shchemerov, I. V.; Vasilev, A. A.; Kulanchikov, Y. O.; Vergeles, P. S.; Yakimov, E. E.; Pearton, S. J. (April 2023, ECS Journal of Solid State Science and Technology)

Theκ-Ga₂O₃polytype is attracting attention because of its high spontaneous electric polarization, which exceeds that of III-Nitrides. However, little is known of its transport and photoconductive properties. The electron beam induced current gain effect in Schottky barriers prepared on thick films ofκ-Ga₂O₃has been studied. It is shown that the gain originates in the depletion region of the Schottky barrier. It is demonstrated that the induced current gain takes place only in some local regions, several which increases with applied bias. Such unusual behavior can be explained by an inhomogeneous distribution of hole traps or by a formation of conductive channels under applied bias.
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Experimental estimation of electron–hole pair creation energy in β -Ga ₂ O ₃

https://doi.org/10.1063/5.0053301

Yakimov, E. B.; Polyakov, A. Y.; Shchemerov, I. V.; Smirnov, N. B.; Vasilev, A. A.; Vergeles, P. S.; Yakimov, E. E.; Chernykh, A. V.; Ren, F.; Pearton, S. J. (May 2021, Applied Physics Letters)

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Role of hole trapping by deep acceptors in electron-beam-induced current measurements in β-Ga ₂ O ₃ vertical rectifiers

https://doi.org/10.1088/1361-6463/abb2bc

Yakimov, E. B.; Polyakov, A. Y.; Smirnov, N. B.; Shchemerov, I. V.; Vergeles, P. S.; Yakimov, E. E.; Chernykh, A. V.; Xian, Minghan; Ren, F.; Pearton, S. J. (October 2020, Journal of Physics D: Applied Physics)
Photosensitivity of Ga ₂ O ₃ Schottky diodes: Effects of deep acceptor traps present before and after neutron irradiation

https://doi.org/10.1063/5.0030105

Yakimov, E. B.; Polyakov, A. Y.; Shchemerov, I. V.; Smirnov, N. B.; Vasilev, A. A.; Vergeles, P. S.; Yakimov, E. E.; Chernykh, A. V.; Shikoh, A. S.; Ren, F.; et al (November 2020, APL Materials)
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