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Passivation of III–V surfaces with crystalline oxidation

https://doi.org/10.1063/1.5126629

Laukkanen, P. ; Punkkinen, M. P. ; Kuzmin, M. ; Kokko, K. ; Lång, J. ; Wallace, R. M. ( March 2021 , Applied Physics Reviews)
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Contact Engineering for Dual-Gate MoS2 Transistors with O2 Plasma Exposure

Bolshakov, P. ; Smyth, C. M. ; Khosravi, A. ; Zhao, P. ; Azcatl, A. ; Mirabelli, G. ; Hurley, P. K. ; Hinkle, C. L. ; Wallace, R. M. ; and Young, C. D. ( December 2018 , IEEE Semiconductor Interface Specialist Conference (SISC))

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