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  1. Abstract X-ray analysis is one of the most robust approaches to extract quantitative information from various materials and is widely used in various fields ever since Raimond Castaing established procedures to analyze electron-induced X-ray signals for materials characterization ‘70 years ago’. The recent development of aberration-correction technology in a (scanning) transmission electron microscopes (S/TEMs) offers refined electron probes below the Å level, making atomic-resolution X-ray analysis possible. In addition, the latest silicon drift detectors allow complex detector arrangements and new configurational designs to maximize the collection efficiency of X-ray signals, which make it feasible to acquire X-ray signals from single atoms. In this review paper, recent progress and advantages related to S/TEM-based X-ray analysis will be discussed: (i) progress in quantification for materials characterization including the recent applications to light element analysis, (ii) progress in analytical spatial resolution for atomic-resolution analysis and (iii) progress in analytical sensitivity toward single-atom detection and analysis in materials. Both atomic-resolution analysis and single-atom analysis are evaluated theoretically through multislice-based calculation for electron propagation in oriented crystalline specimen in combination with X-ray spectrum simulation. 
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  3. We measure the branching fraction of the decayBD0ρ(770)using data collected with the Belle II detector. The data contain 387 millionBB¯pairs produced ine+ecollisions at theϒ(4S)resonance. We reconstruct8360±180decays from an analysis of the distributions of theBenergy and theρ(770)helicity angle. We determine the branching fraction to be(0.939±0.021(stat)±0.050(syst))%, in agreement with previous results. Our measurement improves the relative precision of the world average by more than a factor of two.

    Published by the American Physical Society2024 
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    Free, publicly-accessible full text available June 1, 2025
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  5. We report a measurement of decay-time-dependent charge-parity (CP) asymmetries inB0KS0KS0KS0decays. We use387×106BB¯pairs collected at theϒ(4S)resonance with the Belle II detector at the SuperKEKB asymmetric-energy electron-positron collider. We reconstruct 220 signal events and extract theCP-violating parametersSandCfrom a fit to the distribution of the decay-time difference between the twoBmesons. The resulting confidence region is consistent with previous measurements inB0KS0KS0KS0andB0(cc¯)K0decays and with predictions based on the standard model.

    Published by the American Physical Society2024 
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    Free, publicly-accessible full text available June 1, 2025
  6. We search for the rare decayB+K+νν¯in a362fb1sample of electron-positron collisions at theϒ(4S)resonance collected with the Belle II detector at the SuperKEKB collider. We use the inclusive properties of the accompanyingBmeson inϒ(4S)BB¯events to suppress background from other decays of the signalBcandidate and light-quark pair production. We validate the measurement with an auxiliary analysis based on a conventional hadronic reconstruction of the accompanyingBmeson. For background suppression, we exploit distinct signal features using machine learning methods tuned with simulated data. The signal-reconstruction efficiency and background suppression are validated through various control channels. The branching fraction is extracted in a maximum likelihood fit. Our inclusive and hadronic analyses yield consistent results for theB+K+νν¯branching fraction of[2.7±0.5(stat)±0.5(syst)]×105and[1.10.8+0.9(stat)0.5+0.8(syst)]×105, respectively. Combining the results, we determine the branching fraction of the decayB+K+νν¯to be[2.3±0.5(stat)0.4+0.5(syst)]×105, providing the first evidence for this decay at 3.5 standard deviations. The combined result is 2.7 standard deviations above the standard model expectation.

    Published by the American Physical Society2024 
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    Free, publicly-accessible full text available June 1, 2025