A key objective of the Perseverance rover mission is to acquire samples of Martian rocks for future return to Earth. Eventual laboratory analyses of these samples would address key questions about the evolution of the Martian climate, interior, and habitability. Many such investigations would benefit greatly from samples of Martian bedrock that are oriented in absolute Martian geographic coordinates. However, the Mars 2020 mission was designed without a requirement for orienting the samples. Here we describe a methodology that we developed for orienting rover drill cores in the Martian geographic frame and its application to Perseverance's first 20 rock samples. To orient the cores, three angles were measured: the azimuth and hade of the core pointing vector (i.e., vector oriented along the core axis) and the core roll (i.e., the solid body angle of rotation around the pointing vector). We estimated the core pointing vector from the attitude of the rover's Coring Drill during drilling. To orient the core roll, we used oriented images of asymmetric markings on the bedrock surface acquired with the rover's Wide Angle Topographic Sensor for Operations and eNgineering (WATSON) camera. For most samples, these markings were in the form of natural features on the outcrop, while for four samples they were artificial ablation pits produced by the rover's SuperCam laser. These cores are the first geographically‐oriented (<2.7° 3
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Abstract σ total uncertainty) bedrock samples from another planetary body. This will enable a diversity of paleomagnetic, sedimentological, igneous, tectonic, and astrobiological studies on the returned samples. -
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Rationale Back‐side thinning of wafers is used to eliminate issues with transient sputtering when analyzing near‐surface element distributions. Precise and accurate calibrated implants are created by including a standard reference material during the implantation. Combining these methods allows accurate analysis of low‐fluence, shallow features even if matrix effects are a concern.
Methods Implanted Na (<2.0 × 1011ions/cm2, peaking <50 nm) in diamond‐like carbon (DLC) film on silicon (solar wind returned by NASA's Genesis mission) was prepared for measurement as follows. Implanted surfaces of samples were epoxied to wafers and back‐side‐thinned using physical or chemical methods. Thinned samples were then implanted with reference ions for accurate quantification of the solar wind implant. Analyses used a CAMECA IMS 7f‐GEO SIMS in depth‐profiling mode.
Results Back‐side‐implanted reference ions reduced the need to change sample mounts or stage position and could be spatially separated from the solar wind implant even when measuring monoisotopic ions. Matrix effects in DLC were mitigated and the need to find an identical piece of DLC for a reference implant was eliminated. Accuracy was only limited by the back‐side technique itself.
Conclusions Combining back‐side depth profiling with back‐side‐implanted internal standards aides quantification of shallow mono‐ and polyisotopic implants. This technique helps mitigate matrix effects and keeps measurement conditions consistent. Depth profile acquisition times are longer, but if sample matrices are homogeneous, procedural changes can decrease measurement times.
