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    Observations of planetary material polluting the atmospheres of white dwarfs are an important probe of the bulk composition of exoplanetary material. Medium- and high-resolution optical and ultraviolet spectroscopy of seven white dwarfs with known circumstellar dust and gas emission are presented. Detections or meaningful upper limits for photospheric absorption lines are measured for: C, O, Na, S, P, Mg, Al, Si, Ca, Ti, Cr, Fe, and Ni. For 16 white dwarfs with known observable gaseous emission discs (and measured photospheric abundances), there is no evidence that their accretion rates differ, on average, from those without detectable gaseous emission. This suggests that, typically, accretion is not enhanced by gas drag. At the effective temperature range of the white dwarfs in this sample (16 000–25 000 K) the abundance ratios of elements are more consistent than absolute abundances when comparing abundances derived from spectroscopic white dwarf parameters versus photometric white dwarf parameters. Crucially, this highlights that the uncertainties on white dwarf parameters do not prevent white dwarfs from being utilized to study planetary composition. The abundances of oxygen and silicon for the three hydrogen-dominated white dwarfs in the sample with both optical and ultraviolet spectra differ by 0.62 dex depending on if they are derived from the optical or ultraviolet spectra. This optical/ultraviolet discrepancy may be related to differences in the atmospheric depth of line formation; further investigations into the white dwarf atmospheric modelling are needed to understand this discrepancy.

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  2. Free, publicly-accessible full text available May 1, 2024
  3. This study presents the growth and characterization of an 8.1 μm-emitting, InGaAs/AlInAs/InP-based quantum cascade laser (QCL) formed on an InP-on-Si composite template by metalorganic chemical vapor deposition (MOCVD). First, for the composite-template formation, a GaAs buffer layer was grown by solid-source molecular-beam epitaxy on a commercial (001) GaP/Si substrate, thus forming a GaAs/GaP/Si template. Next, an InP metamorphic buffer layer (MBL) structure was grown atop the GaAs/GaP/Si template by MOCVD, followed by the MOCVD growth of the full QCL structure. The top-surface morphology of the GaAs/GaP/Si template before and after the InP MBL growth was assessed via atomic force microscopy, over a 100 μm2 area, and no antiphase domains were found. The average threading dislocation density (TDD) for the GaAs/GaP/Si template was found to be ∼1 × 109 cm−2, with a slightly lower defect density of ∼7.9 × 108 cm−2 after the InP MBL growth. The lasing performance of the QCL structure grown on Si was compared to that of its counterpart grown on InP native substrate and found to be quite similar. That is, the threshold-current density of the QCL on Si, for deep-etched ridge-guide devices with uncoated facets, is somewhat lower than that for its counterpart on native InP substrate, 1.50 vs 1.92 kA/cm2, while the maximum output power per facet is 1.64 vs 1.47 W. These results further demonstrate the resilience of QCLs to relatively high residual TDD values. 
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    Free, publicly-accessible full text available July 17, 2024
  4. Large-scale network-cloud ecosystems are fundamental infrastructures to support future 5G/6G services, and their resilience is a primary societal concern for the years to come. Differently from a single-entity ecosystem (in which one entity owns the whole infrastructure), in multi-entity ecosystems (in which the networks and datacenters are owned by different entities) cooperation among such different entities is crucial to achieve resilience against large-scale failures. Such cooperation is challenging since diffident entities may not disclose confidential information, e.g., detailed resource availability. To enhance the resilience of multi-entity ecosystems, carriers are important as all the entities rely on carriers’ communication services. Thus, in this study we investigate how to perform carrier cooperative recovery in case of large-scale failures/disasters. We propose a two-stage cooperative recovery planning by incorporating a coordinated scheduling for swift recovery. Through preliminary numerical evaluation, we confirm the potential benefit of carrier cooperation in terms of both recovery time and recovery cost/burden reduction. 
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    Free, publicly-accessible full text available May 1, 2024
  5. We investigate the problem of future disaster-resilient optical network-cloud ecosystems. We introduce our solutions considering openness/disaggregation and cooperation for single- and multi-entity network-cloud ecosystems, respectively. 
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    Free, publicly-accessible full text available April 1, 2024
  6. Room-temperature, pulsed-operation lasing of 8.5  μm-emitting InP-based quantum cascade lasers (QCLs), with low threshold-current density and watt-level output power, is demonstrated from structures grown on (001) GaAs substrates by metal-organic chemical vapor deposition. Prior to growing the laser structure, which contains a 35-stage In 0.53 Ga 0.47 As/In 0.52 Al 0.48 As lattice-matched active-core region, a ∼2  μm-thick nearly fully relaxed InP buffer with strained 1.6 nm-thick InAs quantum-dot-like dislocation-filter layers was grown. A smooth terminal buffer-layer surface, with roughness as low as 0.4 nm on a 10 × 10  μm 2 scale, was obtained, while the estimated threading-dislocation density was in the mid-range × 10 8  cm −2 . A series of measurements, on lasers grown on InP metamorphic buffer layers (MBLs) and on native InP substrates, were performed for understanding the impact of the buffer-layer's surface roughness, residual strain, and threading-dislocation density on unipolar devices such as QCLs. As-cleaved devices, grown on InP MBLs, were fabricated as 25  μm × 3 mm deep-etched ridge guides with lateral current injection. The results are pulsed maximum output power of 1.95 W/facet and a low threshold-current density of 1.86 kA/cm 2 at 293 K. These values are comparable to those obtained from devices grown on InP: 2.09 W/facet and 2.42 kA/cm 2 . This demonstrates the relative insensitivity of the device-performance metrics on high residual threading-dislocation density, and high-performance InP-based QCLs emitting near 8  μm can be achieved on lattice-mismatched substrates. 
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