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Young, Joshua T.; Menyuk, Curtis R.; Hu, Jonathan (, Optica Publishing Group)We compare the full model and phase-matched model for the transverse mode instability. The phase-matched model, which requires less longitudinal discretization with less computational time, predicts the same refractive index gratings as the full model.more » « less
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Wei, Chengli; Young, Joshua T.; Menyuk, Curtis R.; Hu, Jonathan (, OSA Continuum)
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White, Jeffrey O.; Young, Joshua T.; Wei, Chengli; Hu, Jonathan; Menyuk, Curtis R. (, Optics Express)
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