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Abstract Ferromagnetic semiconductor Ga 1– x Mn x As 1– y P y thin films go through a metal–insulator transition at low temperature where electrical conduction becomes driven by hopping of charge carriers. In this regime, we report a colossal negative magnetoresistance (CNMR) coexisting with a saturated magnetic moment, unlike in the traditional magnetic semiconductor Ga 1– x Mn x As. By analyzing the temperature dependence of the resistivity at fixed magnetic field, we demonstrate that the CNMR can be consistently described by the field dependence of the localization length, which relates to a field dependent mobility edge. This dependence is likely due to the random environment of Mn atoms in Ga 1– x Mn x As 1– y P y which causes a random spatial distribution of the mobility that is suppressed by an increasing magnetic field. 

Switching of magnetization by spin–orbit torque in the (Ga,Mn)(As,P) film was studied with currents along ⟨100⟩ crystal directions and an in-plane magnetic field bias. This geometry allowed us to identify the presence of two independent spin–orbit-induced magnetic fields: the Rashba field and the Dresselhaus field. Specifically, we observe that when the in-plane bias field is along the current (I[Formula: see text]H bias ), switching is dominated by the Rashba field, while the Dresselhaus field dominates magnetization reversal when the bias field is perpendicular to the current (I ⊥ H bias ). In our experiments, the magnitudes of the Rashba and Dresselhaus fields were determined to be 2.0 and 7.5 Oe, respectively, at a current density of 8.0 × 10 5 A/cm 2 . 

Abstract Spin–orbit-induced (SOI) effective magnetic field in GaMnAs film with in-plane magnetic anisotropy has been investigated by planar Hall effect measurements. The presence of SOI field was identified by a shift between planar Hall resistance (PHR) hystereses observed with positive and negative currents. The difference of switching fields occurring between the two current polarities, which is determined by the strength of the SOI field, is shown to depend on the external field direction. In this paper we have developed a method for obtaining the magnitude of the SOI fields based on magnetic free energy that includes the effects of magnetic anisotropy and the SOI field. Using this approach, the SOI field for a given current density was accurately obtained by fitting to the observed dependence of the switching fields on the applied field directions. Values of the SOI field obtained with field scan PHR measurements give results that are consistent with those obtained by analyzing the angular dependence of PHR, indicating the reliability of the field scan PHR method for quantifying the SOI-field in GaMnAs films. The magnitude of the SOI field systematically increases with increasing current density, demonstrating the usefulness of SOI fields for manipulation of magnetization by current in GaMnAs films.