skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

Explore Research Products in the PAR
It may take a few hours for recently added research products to appear in PAR search results.


  • Home
  • Search Results
  • Page 1 of 1

Search for: All records

Award ID contains: 1343282

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. ; ; ; (, International Conference on Machine Learning)
    Accepted Manuscript Full Text Available
  2. ; ; ; ; ; (, Device Research Conference)
    Microelectromechanical sensors (MEMS) offer a new way of measuring temperature and infrared (IR) radiation, through measurements of total optical energy, overcoming the obstacles associated with narrow bandgap semiconductor detectors[1]. Specifically, Thin Film Bulk Acoustic Resonators (FBAR) offers a versatile MEMS technology based on resonant devices fabricated using piezoelectric materials [2]. With the addition of an absorbing susceptor and the use of zinc oxide (ZnO) as the piezoelectric it is possible to obtain a higher sensitivity device than previously demonstrated systems, taking advantage of ZnO's higher temperature coefficient of frequency (TCF) [3,4,5]. This work studies the improved sensing ability of an FBAR structure and ease of testing and superior parasitic performance provided in a package using an engineered high TCF FBAR in a monolithically integrated CMOS process. 
    more » « less
    Full Text Available