skip to main content


Search for: All records

Award ID contains: 2020915

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. We investigate stripe patterns formation far from threshold using a combination of topological, analytic, and numerical methods. We first give a definition of the mathematical structure of 'multi-valued' phase functions that are needed for describing layered structures or stripe patterns containing defects. This definition yields insight into the appropriate 'gauge symmetries' of patterns, and leads to the formulation of variational problems, in the class of special functions with bounded variation, to model patterns with defects. We then discuss approaches to discretize and numerically solve these variational problems. These energy minimizing solutions support defects having the same character as seen in experiments.

     
    more » « less
  2. null (Ed.)
  3. null (Ed.)