Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
Abstract We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We describe the sub-Poissonian statistics of the source, the engineering requirements for efficient heralding, and several potential applications. We use simple models of electron beam processes to demonstrate advantages which are situational, but potentially significant in electron lithography and scanning electron microscopy.more » « less
-
Abstract Attosecond science has demonstrated that electrons can be controlled on the sub-cycle time scale of an optical waveform, paving the way towards optical frequency electronics. However, these experiments historically relied on high-energy laser pulses and detection not suitable for microelectronic integration. For practical optical frequency electronics, a system suitable for integration and capable of generating detectable signals with low pulse energies is needed. While current from plasmonic nanoantenna emitters can be driven at optical frequencies, low charge yields have been a significant limitation. In this work we demonstrate that large-scale electrically connected plasmonic nanoantenna networks, when driven in concert, enable charge yields sufficient for single-shot carrier-envelope phase detection at repetition rates exceeding tens of kilohertz. We not only show that limitations in single-shot CEP detection techniques can be overcome, but also demonstrate a flexible approach to optical frequency electronics in general, enabling future applications such as high sensitivity petahertz-bandwidth electric field sampling or logic-circuits.more » « less
-
Free, publicly-accessible full text available February 19, 2026
An official website of the United States government

Full Text Available