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In IoT deployments, it is often necessary to replicate data in failure-prone and resource-constrained computing environments to meet the data availability requirements of smart applications. In this paper, we evaluate the impact of correlated failures on an off-the-shelf probabilistic replica placement strategy for IoT systems via trace-driven simulation. We extend this strategy to handle both correlated failures as well as resource scarcity by estimating the amount of storage capacity required to meet data availability requirements. These advancements lay the foundation for building computing systems that are capable of handling the unique challenge of reliable data access in low-resource environments.
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Free, publicly-accessible full text available December 3, 2026
