Alem, Nasim, Ramasse, Quentin M., Seabourne, Che R., Yazyev, Oleg V., Erickson, Kris, Sarahan, Michael C., Kisielowski, Christian, Scott, Andrew J., Louie, Steven G., and Zettl, A. Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride. Physical Review Letters 109.20 Web. doi:10.1103/PhysRevLett.109.205502.
Alem, Nasim, Ramasse, Quentin M., Seabourne, Che R., Yazyev, Oleg V., Erickson, Kris, Sarahan, Michael C., Kisielowski, Christian, Scott, Andrew J., Louie, Steven G., & Zettl, A. Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride. Physical Review Letters, 109 (20). https://doi.org/10.1103/PhysRevLett.109.205502
Alem, Nasim, Ramasse, Quentin M., Seabourne, Che R., Yazyev, Oleg V., Erickson, Kris, Sarahan, Michael C., Kisielowski, Christian, Scott, Andrew J., Louie, Steven G., and Zettl, A.
"Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride". Physical Review Letters 109 (20). United States: American Physical Society. https://doi.org/10.1103/PhysRevLett.109.205502.https://par.nsf.gov/biblio/10005473.
@article{osti_10005473,
place = {United States},
title = {Subangstrom Edge Relaxations Probed by Electron Microscopy in Hexagonal Boron Nitride},
url = {https://par.nsf.gov/biblio/10005473},
DOI = {10.1103/PhysRevLett.109.205502},
abstractNote = {Not Available},
journal = {Physical Review Letters},
volume = {109},
number = {20},
publisher = {American Physical Society},
author = {Alem, Nasim and Ramasse, Quentin M. and Seabourne, Che R. and Yazyev, Oleg V. and Erickson, Kris and Sarahan, Michael C. and Kisielowski, Christian and Scott, Andrew J. and Louie, Steven G. and Zettl, A.},
}
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