Ivry, Yachin, Kim, Chung-Soo, Dane, Andrew E., De Fazio, Domenico, McCaughan, Adam N., Sunter, Kristen A., Zhao, Qingyuan, and Berggren, Karl K. Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition. Physical Review B 90.21 Web. doi:10.1103/PhysRevB.90.214515.
Ivry, Yachin, Kim, Chung-Soo, Dane, Andrew E., De Fazio, Domenico, McCaughan, Adam N., Sunter, Kristen A., Zhao, Qingyuan, & Berggren, Karl K. Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition. Physical Review B, 90 (21). https://doi.org/10.1103/PhysRevB.90.214515
Ivry, Yachin, Kim, Chung-Soo, Dane, Andrew E., De Fazio, Domenico, McCaughan, Adam N., Sunter, Kristen A., Zhao, Qingyuan, and Berggren, Karl K.
"Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition". Physical Review B 90 (21). United States: American Physical Society. https://doi.org/10.1103/PhysRevB.90.214515.https://par.nsf.gov/biblio/10005781.
@article{osti_10005781,
place = {United States},
title = {Universal scaling of the critical temperature for thin films near the superconducting-to-insulating transition},
url = {https://par.nsf.gov/biblio/10005781},
DOI = {10.1103/PhysRevB.90.214515},
abstractNote = {Not Available},
journal = {Physical Review B},
volume = {90},
number = {21},
publisher = {American Physical Society},
author = {Ivry, Yachin and Kim, Chung-Soo and Dane, Andrew E. and De Fazio, Domenico and McCaughan, Adam N. and Sunter, Kristen A. and Zhao, Qingyuan and Berggren, Karl K.},
}
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