Mayer, Carl R., Molina-Aladareguia, Jon, and Chawla, Nikhilesh. Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography. Retrieved from https://par.nsf.gov/biblio/10025968. Materials Characterization 120.C Web. doi:10.1016/j.matchar.2016.09.023.

Mayer, Carl R., Molina-Aladareguia, Jon, & Chawla, Nikhilesh. Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography. Materials Characterization, 120 (C). Retrieved from https://par.nsf.gov/biblio/10025968. https://doi.org/10.1016/j.matchar.2016.09.023

Mayer, Carl R., Molina-Aladareguia, Jon, and Chawla, Nikhilesh. "Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography". Materials Characterization 120 (C). Country unknown/Code not available. https://doi.org/10.1016/j.matchar.2016.09.023. https://par.nsf.gov/biblio/10025968.

@article{osti_10025968,
place = {Country unknown/Code not available}, title = {Three dimensional (3D) microstructure-based finite element modeling of Al-SiC nanolaminates using focused ion beam (FIB) tomography}, url = {https://par.nsf.gov/biblio/10025968}, DOI = {10.1016/j.matchar.2016.09.023}, abstractNote = {}, journal = {Materials Characterization}, volume = {120}, number = {C}, author = {Mayer, Carl R. and Molina-Aladareguia, Jon and Chawla, Nikhilesh}, }