Hosseini, Poorya, Lue, Niyom, Yaqoob, Zahid, Dasari, Ramachandra R., and So, Peter T. Self-reference line-dispersion interferometric microscopy. Applied Physics Letters 110.13 Web. doi:10.1063/1.4979461.
Hosseini, Poorya, Lue, Niyom, Yaqoob, Zahid, Dasari, Ramachandra R., and So, Peter T.
"Self-reference line-dispersion interferometric microscopy". Applied Physics Letters 110 (13). United States: American Institute of Physics. https://doi.org/10.1063/1.4979461.https://par.nsf.gov/biblio/10033286.
@article{osti_10033286,
place = {United States},
title = {Self-reference line-dispersion interferometric microscopy},
url = {https://par.nsf.gov/biblio/10033286},
DOI = {10.1063/1.4979461},
abstractNote = {Not Available},
journal = {Applied Physics Letters},
volume = {110},
number = {13},
publisher = {American Institute of Physics},
author = {Hosseini, Poorya and Lue, Niyom and Yaqoob, Zahid and Dasari, Ramachandra R. and So, Peter T.},
}
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