Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material
- NSF-PAR ID:
- 10052634
- Publisher / Repository:
- American Institute of Physics
- Date Published:
- Journal Name:
- Journal of Applied Physics
- Volume:
- 119
- Issue:
- 3
- ISSN:
- 0021-8979
- Page Range / eLocation ID:
- 035101
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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