Dreyer, Cyrus E., Alkauskas, Audrius, Lyons, John L., Janotti, Anderson, and Van de Walle, Chris G. First-Principles Calculations of Point Defects for Quantum Technologies. Retrieved from https://par.nsf.gov/biblio/10053307. Annual Review of Materials Research 48.1 Web. doi:10.1146/annurev-matsci-070317-124453.

Dreyer, Cyrus E., Alkauskas, Audrius, Lyons, John L., Janotti, Anderson, & Van de Walle, Chris G. First-Principles Calculations of Point Defects for Quantum Technologies. Annual Review of Materials Research, 48 (1). Retrieved from https://par.nsf.gov/biblio/10053307. https://doi.org/10.1146/annurev-matsci-070317-124453

Dreyer, Cyrus E., Alkauskas, Audrius, Lyons, John L., Janotti, Anderson, and Van de Walle, Chris G. "First-Principles Calculations of Point Defects for Quantum Technologies". Annual Review of Materials Research 48 (1). Country unknown/Code not available. https://doi.org/10.1146/annurev-matsci-070317-124453. https://par.nsf.gov/biblio/10053307.

@article{osti_10053307,
place = {Country unknown/Code not available}, title = {First-Principles Calculations of Point Defects for Quantum Technologies}, url = {https://par.nsf.gov/biblio/10053307}, DOI = {10.1146/annurev-matsci-070317-124453}, abstractNote = {}, journal = {Annual Review of Materials Research}, volume = {48}, number = {1}, author = {Dreyer, Cyrus E. and Alkauskas, Audrius and Lyons, John L. and Janotti, Anderson and Van de Walle, Chris G.}, }