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Title: Reliability perspective of resistive synaptic devices on the neuromorphic system performance
Award ID(s):
1740225
PAR ID:
10063212
Author(s) / Creator(s):
;
Date Published:
Journal Name:
2018 IEEE International Reliability Physics Symposium (IRPS)
Page Range / eLocation ID:
5C.4-1 to 5C.4-4
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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