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Electron Backscatter Diffraction (EBSD) is a widely used approach for characterising the microstructure of various materials. However, it is difficult to accurately distinguish similar (body centred cubic and body centred tetragonal, with small tetragonality) phases in steels using standard EBSD software. One method to tackle the problem of phase distinction is to measure the tetragonality of the phases, which can be done using simulated patterns and cross‐correlation techniques to detect distortion away from a perfectly cubic crystal lattice. However, small errors in the determination of microscope geometry (the so‐called pattern or projection centre) can cause significant errors in tetragonality measurement and lead to erroneous results. This paper utilises a new approach for accurate pattern centre determination via a strain minimisation routine across a large number of grains in dual phase steels. Tetragonality maps are then produced and used to identify phase and estimate local carbon content. The technique is implemented using both kinetically simulated and dynamically simulated patterns to determine their relative accuracy. Tetragonality maps, and subsequent phase maps, based on dynamically simulated patterns in a point‐by‐point and grain average comparison are found to consistently produce more precise and accurate results, with close to 90% accuracy for grain phase identification, when compared with an image‐quality identification method. The error in tetragonality measurements appears to be of the order of 1%, thus producing a commensurate ∼0.2% error in carbon content estimation. Such an error makes the technique unsuitable for estimation of total carbon content of most commercial steels, which often have carbon levels below 0.1%. However, even in the DP steel for this study (0.1 wt.% carbon) it can be used to map carbon in regions with higher accumulation (such as in martensite with nonhomogeneous carbon content). Lay DescriptionElectron Backscatter Diffraction (EBSD) is a widely used approach for characterising the microstructure of various materials. However, it is difficult to accurately distinguish similar (BCC and BCT) phases in steels using standard EBSD software due to the small difference in crystal structure. One method to tackle the problem of phase distinction is to measure the tetragonality, or apparent ‘strain’ in the crystal lattice, of the phases. This can be done by comparing experimental EBSD patterns with simulated patterns via cross‐correlation techniques, to detect distortion away from a perfectly cubic crystal lattice. However, small errors in the determination of microscope geometry (the so‐called pattern or projection centre) can cause significant errors in tetragonality measurement and lead to erroneous results. This paper utilises a new approach for accurate pattern centre determination via a strain minimisation routine across a large number of grains in dual phase steels. Tetragonality maps are then produced and used to identify phase and estimate local carbon content. The technique is implemented using both simple kinetically simulated and more complex dynamically simulated patterns to determine their relative accuracy. Tetragonality maps, and subsequent phase maps, based on dynamically simulated patterns in a point‐by‐point and grain average comparison are found to consistently produce more precise and accurate results, with close to 90% accuracy for grain phase identification, when compared with an image‐quality identification method. The error in tetragonality measurements appears to be of the order of 1%, thus producing a commensurate error in carbon content estimation. Such an error makes an estimate of total carbon content particularly unsuitable for low carbon steels; although maps of local carbon content may still be revealing.Application of the method developed in this paper will lead to better understanding of the complex microstructures of steels, and the potential to design microstructures that deliver higher strength and ductility for common applications, such as vehicle components.
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Methods for Conducting Electron Backscattered Diffraction (EBSD) on Polycrystalline Organic Molecular Thin Films
Abstract Electron backscattered diffraction (EBSD) is a technique regularly used to obtain crystallographic information from inorganic samples. When EBSD is acquired simultaneously with emitting diodes data, a sample can be thoroughly characterized both structurally and compositionally. For organic materials, coherent Kikuchi patterns do form when the electron beam interacts with crystalline material. However, such patterns tend to be weak due to the low average atomic number of organic materials. This is compounded by the fact that the patterns fade quickly and disappear completely once a critical electron dose is exceeded, inhibiting successful collection of EBSD maps from them. In this study, a new approach is presented that allows successful collection of EBSD maps from organic materials, here the extreme example of a hydrocarbon organic molecular thin film, and opens new avenues of characterization for crystalline organic materials.
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- Award ID(s):
- 1709222
- PAR ID:
- 10064594
- Date Published:
- Journal Name:
- Microscopy and Microanalysis
- ISSN:
- 1431-9276
- Page Range / eLocation ID:
- 1 to 4
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1017/S1431927618000442
