Abstract Molecular orientation plays a critical role in controlling carrier transport in organic semiconductors (OSCs). However, this aspect has not been explored for surface doping of OSC thin films. The challenge lies in lack of methods to precisely modulate relative molecular orientation between the dopant and the OSC host. Here, the impact of molecular orientation on dopant–host electronic interactions by large modulation of conjugated polymer orientation via solution coating is reported. Combining synchrotron‐radiation X‐ray measurements with spectroscopic and electrical characterizations, a quantitative correlation between doping‐enhanced charge carrier mobility and the Herman's orientation parameter is presented. This direct correlation can be attributed to enhanced charge‐transfer interactions at host/dopant interface with increasing face‐on orientation of the polymer. These results demonstrate that the surface doping effect can be fundamentally manipulated by controlling the molecular orientation of the OSC layer, enabling optimization of carrier transport.
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Polymorphism controls the degree of charge transfer in a molecularly doped semiconducting polymer
When an organic semiconductor (OSC) is blended with an electron acceptor molecule that can act as a p-type dopant, there should ideally be complete (integer) transfer of charge from the OSC to the dopant. However, some dopant–OSC blends instead form charge transfer complexes (CTCs), characterized by fractional charge transfer (CT) and strong orbital hybridization between the two molecules. Fractional CT doping does not efficiently generate free charge carriers, but it is unclear what conditions lead to incomplete charge transfer. Here we show that by modifying film processing conditions in the semiconductor–dopant couple poly(3-hexylthiophene):2,3,5,6-tetrafluoro-7,7,8,8,-tetracyanoquinodimethane (P3HT:F4TCNQ), we can selectively obtain nearly pure integer or fractional CT phases. Fractional CT films show electrical conductivities approximately 2 orders of magnitude lower than corresponding integer CT films, and remarkably different optical absorption spectra. Grazing incidence wide-angle X-ray diffraction (GIXD) reveals that fractional CT films display an unusually dense and well-ordered crystal structure. These films show lower paracrystallinity and shorter lamellar and π-stacking distances than undoped films processed under similar conditions. Using plane-wave DFT we obtain a structure with unit cell parameters closely matching those observed by GIXD. This first-ever observation of both fractional and integer CT in a single OSC–dopant system demonstrates the importance of structural effects on OSC doping and opens the door to further studies.
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- Award ID(s):
- 1636385
- PAR ID:
- 10065406
- Date Published:
- Journal Name:
- Materials Horizons
- Volume:
- 5
- Issue:
- 4
- ISSN:
- 2051-6347
- Page Range / eLocation ID:
- 655 to 660
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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