A Yield-Reliability Relation Modeling Approach based on Random Effects Degradation Models
- Award ID(s):
- 1633500
- NSF-PAR ID:
- 10067978
- Date Published:
- Journal Name:
- ASIA PACIFIC CONFERENCE OF THE PROGNOSTICS AND HEALTH MANAGEMENT SOCIETY 2017
- Page Range / eLocation ID:
- 791-794
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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