Hong, Yili, Zhang, Man, and Meeker, William Q. Big data and reliability applications: The complexity dimension. Retrieved from https://par.nsf.gov/biblio/10073123. Journal of Quality Technology 50.2 Web. doi:10.1080/00224065.2018.1438007.
Hong, Yili, Zhang, Man, & Meeker, William Q. Big data and reliability applications: The complexity dimension. Journal of Quality Technology, 50 (2). Retrieved from https://par.nsf.gov/biblio/10073123. https://doi.org/10.1080/00224065.2018.1438007
@article{osti_10073123,
place = {Country unknown/Code not available},
title = {Big data and reliability applications: The complexity dimension},
url = {https://par.nsf.gov/biblio/10073123},
DOI = {10.1080/00224065.2018.1438007},
abstractNote = {},
journal = {Journal of Quality Technology},
volume = {50},
number = {2},
author = {Hong, Yili and Zhang, Man and Meeker, William Q.},
}
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