Das, Debayan, Maity, Shovan, Nasir, Saad Bin, Ghosh, Santosh, Raychowdhury, Arijit, and Sen, Shreyas. ASNI: Attenuated Signature Noise Injection for Low-Overhead Power Side-Channel Attack Immunity. Retrieved from https://par.nsf.gov/biblio/10076479. IEEE Transactions on Circuits and Systems I: Regular Papers 65.10 Web. doi:10.1109/tcsi.2018.2819499.

Das, Debayan, Maity, Shovan, Nasir, Saad Bin, Ghosh, Santosh, Raychowdhury, Arijit, & Sen, Shreyas. ASNI: Attenuated Signature Noise Injection for Low-Overhead Power Side-Channel Attack Immunity. IEEE Transactions on Circuits and Systems I: Regular Papers, 65 (10). Retrieved from https://par.nsf.gov/biblio/10076479. https://doi.org/10.1109/tcsi.2018.2819499

Das, Debayan, Maity, Shovan, Nasir, Saad Bin, Ghosh, Santosh, Raychowdhury, Arijit, and Sen, Shreyas. "ASNI: Attenuated Signature Noise Injection for Low-Overhead Power Side-Channel Attack Immunity". IEEE Transactions on Circuits and Systems I: Regular Papers 65 (10). Country unknown/Code not available. https://doi.org/10.1109/tcsi.2018.2819499. https://par.nsf.gov/biblio/10076479.

@article{osti_10076479,
place = {Country unknown/Code not available}, title = {ASNI: Attenuated Signature Noise Injection for Low-Overhead Power Side-Channel Attack Immunity}, url = {https://par.nsf.gov/biblio/10076479}, DOI = {10.1109/tcsi.2018.2819499}, abstractNote = {}, journal = {IEEE Transactions on Circuits and Systems I: Regular Papers}, volume = {65}, number = {10}, author = {Das, Debayan and Maity, Shovan and Nasir, Saad Bin and Ghosh, Santosh and Raychowdhury, Arijit and Sen, Shreyas}, }