Zhou, Tianji, Zheng, Pengyuan, Pandey, Sumeet C., Sundararaman, Ravishankar, and Gall, Daniel. The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges. Journal of Applied Physics 123.15 Web. doi:10.1063/1.5020577.

Zhou, Tianji, Zheng, Pengyuan, Pandey, Sumeet C., Sundararaman, Ravishankar, & Gall, Daniel. The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges. Journal of Applied Physics, 123 (15). https://doi.org/10.1063/1.5020577

Zhou, Tianji, Zheng, Pengyuan, Pandey, Sumeet C., Sundararaman, Ravishankar, and Gall, Daniel. "The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges". Journal of Applied Physics 123 (15). Japan: American Institute of Physics. https://doi.org/10.1063/1.5020577. https://par.nsf.gov/biblio/10077668.

@article{osti_10077668,
place = {Japan}, title = {The electrical resistivity of rough thin films: A model based on electron reflection at discrete step edges}, url = {https://par.nsf.gov/biblio/10077668}, DOI = {10.1063/1.5020577}, abstractNote = {Not Available}, journal = {Journal of Applied Physics}, volume = {123}, number = {15}, publisher = {American Institute of Physics}, author = {Zhou, Tianji and Zheng, Pengyuan and Pandey, Sumeet C. and Sundararaman, Ravishankar and Gall, Daniel}, }