Breckenridge, M. Hayden, Tweedie, James, Hernandez-Balderrama, Luis, Kirste, Ronny, Klump, Andrew, Collazo, Ramon, Reddy, Pramod, and Sitar, Zlatko. Electrical and Structural Characterization of Si Implanted Homoepitaxially Grown AlN. Retrieved from https://par.nsf.gov/biblio/10088192. 2018 IEEE Research and Applications of Photonics In Defense Conference (RAPID) . Web. doi:10.1109/RAPID.2018.8508915.

Breckenridge, M. Hayden, Tweedie, James, Hernandez-Balderrama, Luis, Kirste, Ronny, Klump, Andrew, Collazo, Ramon, Reddy, Pramod, & Sitar, Zlatko. Electrical and Structural Characterization of Si Implanted Homoepitaxially Grown AlN. 2018 IEEE Research and Applications of Photonics In Defense Conference (RAPID), (). Retrieved from https://par.nsf.gov/biblio/10088192. https://doi.org/10.1109/RAPID.2018.8508915

Breckenridge, M. Hayden, Tweedie, James, Hernandez-Balderrama, Luis, Kirste, Ronny, Klump, Andrew, Collazo, Ramon, Reddy, Pramod, and Sitar, Zlatko. "Electrical and Structural Characterization of Si Implanted Homoepitaxially Grown AlN". 2018 IEEE Research and Applications of Photonics In Defense Conference (RAPID) (). Country unknown/Code not available. https://doi.org/10.1109/RAPID.2018.8508915. https://par.nsf.gov/biblio/10088192.

@article{osti_10088192,
place = {Country unknown/Code not available}, title = {Electrical and Structural Characterization of Si Implanted Homoepitaxially Grown AlN}, url = {https://par.nsf.gov/biblio/10088192}, DOI = {10.1109/RAPID.2018.8508915}, abstractNote = {}, journal = {2018 IEEE Research and Applications of Photonics In Defense Conference (RAPID)}, author = {Breckenridge, M. Hayden and Tweedie, James and Hernandez-Balderrama, Luis and Kirste, Ronny and Klump, Andrew and Collazo, Ramon and Reddy, Pramod and Sitar, Zlatko}, }