Zhang, Jiangwei, Kline, Donald, Fang, Liang, Melhem, Rami, and Jones, Alex K. Data Block Partitioning Methods to Mitigate Stuck-At Faults in Limited Endurance Memories. Retrieved from https://par.nsf.gov/biblio/10088249. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26.11 Web. doi:10.1109/TVLSI.2018.2858186.

Zhang, Jiangwei, Kline, Donald, Fang, Liang, Melhem, Rami, & Jones, Alex K. Data Block Partitioning Methods to Mitigate Stuck-At Faults in Limited Endurance Memories. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 26 (11). Retrieved from https://par.nsf.gov/biblio/10088249. https://doi.org/10.1109/TVLSI.2018.2858186

Zhang, Jiangwei, Kline, Donald, Fang, Liang, Melhem, Rami, and Jones, Alex K. "Data Block Partitioning Methods to Mitigate Stuck-At Faults in Limited Endurance Memories". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (11). Country unknown/Code not available. https://doi.org/10.1109/TVLSI.2018.2858186. https://par.nsf.gov/biblio/10088249.

@article{osti_10088249,
place = {Country unknown/Code not available}, title = {Data Block Partitioning Methods to Mitigate Stuck-At Faults in Limited Endurance Memories}, url = {https://par.nsf.gov/biblio/10088249}, DOI = {10.1109/TVLSI.2018.2858186}, abstractNote = {}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, volume = {26}, number = {11}, author = {Zhang, Jiangwei and Kline, Donald and Fang, Liang and Melhem, Rami and Jones, Alex K.}, }